Abstract: The interconnection of cut cells is a way to improve cell to module efficiency ratio. While this approach minimizes series resistance losses and improves module area utilization, it introduces recombination losses due to imperfect cuts. We propose two additional methods to characterize edge recombination based on multi-wavelength light beam induced current (LBIC) measurements and current-dependent spatially resolved electroluminescence (EL). We test the methods on interdigitated back contact silicon solar cells, which were cut in our laboratory...
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