@article{https://doi.org/10.4229/eupvsec20202020-2cv.1.9,<br/><span class="tab"></span>
  doi = {10.4229/EUPVSEC20202020-2CV.1.9},<br/><span class="tab"></span>
  url = {https://userarea.eupvsec.org/proceedings/EU-PVSEC-2020/2CV.1.9/},<br/><span class="tab"></span>
  author = {Bokalic,<br/><span class="tab"></span> M. and Kikelj,<br/><span class="tab"></span> M. and Brecl,<br/><span class="tab"></span> K. and Jankovec,<br/><span class="tab"></span> M. and Buchholz,<br/><span class="tab"></span> F. and Mihailetchi,<br/><span class="tab"></span> V. and Topic,<br/><span class="tab"></span> M.},<br/><span class="tab"></span>
  keywords = {Silicon Materials and Cells,<br/><span class="tab"></span> Characterisation &amp; Simulation of Si Cells},<br/><span class="tab"></span>
  language = {en},<br/><span class="tab"></span>
  title = {EL and LBIC Characterization of Cut Edge Recombination in IBC Solar Cells},<br/><span class="tab"></span>
  journal = {37th European Photovoltaic Solar Energy Conference and Exhibition; 308-311},<br/><span class="tab"></span>
  publisher = {WIP},<br/><span class="tab"></span>
  year = {2020}
}