Authors: DUTERTRE, Jean-Max, Beroulle, Vincent, Candelier, Philippe, Faber, Louis-Barthelemy, Flottes, Marie-Lise, Gendrier, Hely, David, Leveugle, Régis, Maistri, Paolo, Di Natale, Giorgio, Papadimitriou, Athanasios, Rouzeyre, Bruno
Venue: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)
Type: Publication
Abstract: International audience; At first used to emulate the effects of radioactive ionizing particules passing through integrated circuits (ICs), laser illumination is also used to inject faults into the computations of secure ICs for the purpose of retrieving secret data. The CMOS FD-SOI technology is expected to be less sensitive to laser faults injection than the more usual CMOS bulk technology. We report in this work an experimental assessment of the interest of using FD-SOI rather than CMOS bulk to decrease laser sensitivity. Our experiments were...
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Topics: 
Optoelectronics
Electronic engineering
Electrical engineering
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