Abstract: International audience; Process, voltage, temperature and ageing variations have become important issues in nanometre technology nodes, and thus on-chip accurate reliability and performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing compensation. Voltage and frequency scaling techniques are combined with mo...
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Topics: 
Reliability engineering
Electronic engineering
Embedded system