George Theodorou; Serafeim Chatzopoulos; Nektarios Kranitis; Antonis M. Paschalis; Dimitris Gizopoul (...)
2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ·
2012
VLSI and Analog Circuit Testing
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Engineering and Test Systems
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Integrated Circuits and Semiconductor Failure Analysis
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Data curation
Methodology
Project administration