@misc{https://doi.org/10.4121/14995089,<br/><span class="tab"></span>
  doi = {10.4121/14995089},<br/><span class="tab"></span>
  url = {https://data.4tu.nl/articles/_/14995089},<br/><span class="tab"></span>
  author = {Cnossen,<br/><span class="tab"></span> Jelmer and Smith,<br/><span class="tab"></span> Carlas},<br/><span class="tab"></span>
  keywords = {Nanotechnology,<br/><span class="tab"></span> FOS: Nanotechnology,<br/><span class="tab"></span> drift estimation,<br/><span class="tab"></span> smlm,<br/><span class="tab"></span> localization microscopy},<br/><span class="tab"></span>
  title = {Image data associated with the publication: Drift correction in localization microscopy using entropy minimization},<br/><span class="tab"></span>
  publisher = {4TU.ResearchData},<br/><span class="tab"></span>
  year = {2021},<br/><span class="tab"></span>
  copyright = {MIT License}
}