@article{Lama_2020,
title={Reliability analysis in GeTe and GeSbTe based phase-change memory 4 kb arrays targeting storage class memory applications},
volume={114},
ISSN={0026-2714},
url={http://dx.doi.org/10.1016/j.microrel.2020.113823},
DOI={10.1016/j.microrel.2020.113823},
journal={Microelectronics Reliability},
publisher={Elsevier BV},
author={Lama,
G. and Bourgeois,
G. and Bernard,
M. and Castellani,
N. and Sandrini,
J. and Nolot,
E. and Garrione,
J. and Cyrille,
M.C. and Navarro,
G. and Nowak,
E.},
year={2020},
month=nov,
pages={113823} }